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An introduction to surface analysis by XPS and AES / John F. Watts, John Wolstenholme.
Material type:
TextPublication details: Chichester, West Sussex, England ; New York : J. Wiley, c2003.Description: x, 212 p. : ill. ; 24 cmISBN: - 9780470847138
- 620.44 WAT
Contents:
Electron spectroscopy: some basic concepts -- Electron spectrometer design -- The electron spectrum: qualitative and quantitative interpretation -- Compositional depth profiling -- Applications of electron spectroscopy in materials science -- Comparison of XPS and AES with other analytical techniques -- Glossary -- Bibliography -- Appendices
| Item type | Current library | Call number | Status | Date due | Barcode | Item holds |
|---|---|---|---|---|---|---|
Books
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Learning Resource Centre | 620.44 WAT (Browse shelf(Opens below)) | Available | 3371 |
Total holds: 0
Includes bibliographical references (p. [195]-202) and index.
Electron spectroscopy: some basic concepts -- Electron spectrometer design -- The electron spectrum: qualitative and quantitative interpretation -- Compositional depth profiling -- Applications of electron spectroscopy in materials science -- Comparison of XPS and AES with other analytical techniques -- Glossary -- Bibliography -- Appendices
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