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Microscopic x-ray fluorescence analysis / edited by Koen H.A. Janssens, Freddy C.V. Adams, Anders Rindby.

Contributor(s): Material type: TextTextPublication details: Chichester ; New York : Wiley, 2000.Description: xiv, 419 p. : ill. (some col.) ; 24 cmISBN:
  • 0471974269 (alk. paper)
Subject(s): DDC classification:
  • 543.56 23 MIC
LOC classification:
  • QD96 .M53 2000
Online resources:
Contents:
Overview -- Interaction of X-Ray with matter -- Microfocusing X-Ray optics -- Instrumentation for u-XRF with laboratory sources -- Instrumentation for u-XRF at synchrotron sources -- Evaluation and calibration of u-XRF data -- Comparison with other microanalytical techniques -- Application in the geological sciences -- Applications in art an archeology -- Environmental and biological applications of u-XRF -- Industrial applications of u-XRF -- The future of u-XRF
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Holdings
Item type Current library Collection Call number Status Date due Barcode Item holds
Books Books Learning Resource Centre Reference Collection 543.56 MIC (Browse shelf(Opens below)) Not for loan 3368
Total holds: 0

Includes bibliographical references and index.

Overview -- Interaction of X-Ray with matter -- Microfocusing X-Ray optics -- Instrumentation for u-XRF with laboratory sources -- Instrumentation for u-XRF at synchrotron sources -- Evaluation and calibration of u-XRF data -- Comparison with other microanalytical techniques -- Application in the geological sciences -- Applications in art an archeology -- Environmental and biological applications of u-XRF -- Industrial applications of u-XRF -- The future of u-XRF

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