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Nanometer technology designs : high-quality delay tests / Mohammad Tehranipoor and Nisar Ahmed.
Material type:
TextPublication details: New York, NY : Springer, c2008.Description: xvii, 281 p. : ill. ; 25 cmISBN: - 9780387764863 (hdbk. : acidfree paper)
- 0387764860 (hdbk. : acidfree paper)
- 621.381548 22 TEH
Contents:
Ch.1. Introduction -- Ch.2. At-speed test challenges for nanometer technology -- Ch.3. Local at-speed scan enable generation using low-cost testers -- Ch.4. Enhanced launch-off capture -- Ch.5. Hybrid scan-based transition delay test -- Ch.6. Avoiding functionally untestable faults -- Ch.7. Screening small delay defects -- Ch.8. Faster-than-at-speed test considering IR-drop effects -- Ch.9. IR-drop tolerant At-speed test pattern generation -- Ch.10. Pattern generation for power supply noise analysis -- Ch.11. Delay fault testing in presence of maximum crosstalk -- Ch.12. Testing SoC interconnects for signal integrity --
| Item type | Current library | Collection | Call number | Status | Date due | Barcode | Item holds |
|---|---|---|---|---|---|---|---|
Reference
|
Learning Resource Centre | Reference Collection | 621.381548 TEH (Browse shelf(Opens below)) | Not for loan | 3154 |
Total holds: 0
Includes bibliographical references and index.
Ch.1. Introduction -- Ch.2. At-speed test challenges for nanometer technology -- Ch.3. Local at-speed scan enable generation using low-cost testers -- Ch.4. Enhanced launch-off capture -- Ch.5. Hybrid scan-based transition delay test -- Ch.6. Avoiding functionally untestable faults -- Ch.7. Screening small delay defects -- Ch.8. Faster-than-at-speed test considering IR-drop effects -- Ch.9. IR-drop tolerant At-speed test pattern generation -- Ch.10. Pattern generation for power supply noise analysis -- Ch.11. Delay fault testing in presence of maximum crosstalk -- Ch.12. Testing SoC interconnects for signal integrity --
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