MARC details
| 000 -LEADER |
|---|
| fixed length control field |
02070cam a22002894a 4500 |
| CONTROL NUMBER |
|---|
| control field |
12883029 |
| DATE AND TIME OF LATEST TRANSACTION |
|---|
| control field |
20121221143138.0 |
| FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION |
|---|
| fixed length control field |
020803s2003 nyua b 001 0 eng |
| LIBRARY OF CONGRESS CONTROL NUMBER |
|---|
| LC control number |
2002028276 |
| INTERNATIONAL STANDARD BOOK NUMBER |
|---|
| International Standard Book Number |
9780306472923 |
| CATALOGING SOURCE |
|---|
| Original cataloging agency |
DLC |
| Transcribing agency |
DLC |
| Modifying agency |
DLC |
| AUTHENTICATION CODE |
|---|
| Authentication code |
pcc |
| DEWEY DECIMAL CLASSIFICATION NUMBER |
|---|
| Classification number |
502.825 |
| Edition number |
21 |
| Item number |
SCA |
| TITLE STATEMENT |
|---|
| Title |
Scanning electron microscopy and x-ray microanalysis / |
| Statement of responsibility, etc |
Joseph I. Goldstein ... [et al.]. |
| EDITION STATEMENT |
|---|
| Edition statement |
3rd ed. |
| PUBLICATION, DISTRIBUTION, ETC. (IMPRINT) |
|---|
| Place of publication, distribution, etc |
New York : |
| Name of publisher, distributor, etc |
Springer |
| Date of publication, distribution, etc |
c2003. |
| PHYSICAL DESCRIPTION |
|---|
| Extent |
xix, 689 p. : |
| Other physical details |
ill. (some col.) ; |
| Dimensions |
26 cm. + |
| Accompanying material |
1 CD-ROM (4 3/4 in.) |
| BIBLIOGRAPHY, ETC. NOTE |
|---|
| Bibliography, etc |
Includes bibliographical references and index. |
| FORMATTED CONTENTS NOTE |
|---|
| Formatted contents note |
Contents: Ch.1. Introduction Ch.2. The SEM and its Modes of operation -- Ch.3. Electron Beam-specimen interactions -- Ch.4. Image formation and interpretation -- Ch.5. Special topics in scanning electron microscopy -- Ch.6. Generation of X-Ray in the SEM specimen -- Ch.7. X-Ray spectral measurement: EDS and WDS -- Ch.8. Qualitative X-Ray analysis -- Ch.9. Quantitative X-Ray analysis: The basics -- Ch.10.Special topics in electron beam X-Ray microanalysis -- Ch.11. Specimen preparation of hard materials: Metals, ceramics, rocks, minerals, microelectronic and packaged devices, particles, and fibers -- Ch.12. Specimen preparation of polymer materials -- Ch.13. Ambient-temperature specimen preparation of biological material -- Ch.14. Low-temperature specimen preparation -- Ch.15. Procedures for elimination of charging in nonconducting specimens |
| SUBJECT ADDED ENTRY--TOPICAL TERM |
|---|
| Topical term or geographic name as entry element |
Scanning electron microscopy. |
| 9 (RLIN) |
4960 |
| SUBJECT ADDED ENTRY--TOPICAL TERM |
|---|
| Topical term or geographic name as entry element |
X-ray microanalysis. |
| 9 (RLIN) |
4961 |
| ADDED ENTRY--PERSONAL NAME |
|---|
| Personal name |
Goldstein, Joseph I |
| -- |
Lyman, Charles E |
| -- |
Newbury, Dale E |
| -- |
Lifshin, Eric |
| -- |
Echlin, Patrick |
| -- |
Sawyer, Linda |
| -- |
Joy, David C |
| -- |
Michael, Joseph R |
| 9 (RLIN) |
4962 |
| ELECTRONIC LOCATION AND ACCESS |
|---|
| Materials specified |
Publisher description |
| Uniform Resource Identifier |
<a href="http://www.loc.gov/catdir/enhancements/fy0813/2002028276-d.html">http://www.loc.gov/catdir/enhancements/fy0813/2002028276-d.html</a> |
| LOCAL DATA ELEMENT F, LDF (RLIN) |
|---|
| a |
7 |
| b |
cbc |
| c |
orignew |
| d |
1 |
| e |
ocip |
| f |
20 |
| g |
y-gencatlg |
| ADDED ENTRY ELEMENTS (KOHA) |
|---|
| Source of classification or shelving scheme |
Dewey Decimal Classification |
| Item type |
Reference |
