Scanning electron microscopy and x-ray microanalysis / 
Joseph I. Goldstein ... [et al.]. 
 - 3rd ed. 
 - New York :  Springer  c2003. 
 - xix, 689 p. :  ill. (some col.) ;  26 cm. +  1 CD-ROM (4 3/4 in.) 
<br/><br/>Includes bibliographical references and index. 
<br/><br/>Contents: Ch.1. Introduction Ch.2. The SEM and its Modes of operation -- Ch.3. Electron Beam-specimen interactions -- Ch.4. Image formation and interpretation -- Ch.5. Special topics in scanning electron microscopy -- Ch.6. Generation of X-Ray in the SEM specimen -- Ch.7. X-Ray spectral measurement: EDS and WDS -- Ch.8. Qualitative X-Ray analysis -- Ch.9. Quantitative X-Ray analysis: The basics -- Ch.10.Special topics in electron beam X-Ray microanalysis -- Ch.11. Specimen preparation of hard materials: Metals, ceramics, rocks, minerals, microelectronic and packaged devices, particles, and fibers -- Ch.12. Specimen preparation of polymer materials -- Ch.13. Ambient-temperature specimen preparation of biological material -- Ch.14. Low-temperature specimen preparation -- Ch.15. Procedures for elimination of charging in nonconducting specimens 
<br/><br/><label>ISBN: </label>9780306472923 
<br/><br/><label>LCCN: </label>2002028276 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Scanning electron microscopy.<br/>X-ray microanalysis.
<br/><br/><label>Dewey Class. No.: </label>502.825  / SCA