TY  - BOOK
AU  - Goldstein,Joseph I
TI  - Scanning electron microscopy and x-ray microanalysis
SN  - 9780306472923
U1  - 502.825 21
PY  - 2003///
CY  - New York
PB  - Springer
KW  - Scanning electron microscopy
KW  - X-ray microanalysis
N1  - Includes bibliographical references and index; Contents: Ch.1. Introduction Ch.2. The SEM and its Modes of operation -- Ch.3. Electron Beam-specimen interactions -- Ch.4. Image formation and interpretation -- Ch.5. Special topics in scanning electron microscopy -- Ch.6. Generation of X-Ray in the SEM specimen -- Ch.7. X-Ray spectral measurement: EDS and WDS -- Ch.8. Qualitative X-Ray analysis -- Ch.9. Quantitative X-Ray analysis: The basics -- Ch.10.Special topics in electron beam X-Ray microanalysis -- Ch.11. Specimen preparation of hard materials: Metals, ceramics, rocks, minerals, microelectronic and packaged devices, particles, and fibers -- Ch.12. Specimen preparation of polymer materials -- Ch.13. Ambient-temperature specimen preparation of biological material -- Ch.14. Low-temperature specimen preparation -- Ch.15. Procedures for elimination of charging in nonconducting specimens
UR  - http://www.loc.gov/catdir/enhancements/fy0813/2002028276-d.html
ER  -