Semiconductor modeling for simulating signal, power, and electromagnetic integrity / Roy G. Leventhal, Lynne Green ; contributing author, Darren J. Carpenter.
Material type: TextPublication details: New Delhi : New Age International, Springer, 2009, c2006.Description: xx, 766 p. : ill. ; 25 cm. + 1 CD-ROM (4 3/4 in.)ISBN:- 9780387241593 ($90.00)
- 0387241590 ($90.00)
- 621.38152015118 LEV
Item type | Current library | Call number | Status | Date due | Barcode | Item holds |
---|---|---|---|---|---|---|
CDs and DVDs | Learning Resource Centre | Not for loan | CD662 | |||
Books | Learning Resource Centre | 621.38152015118 LEV (Browse shelf(Opens below)) | Available | 8619 |
CD-ROM includes Sonnet Lite, Visual IBIS Editor, and appendixes including example data sheets, sample model files, IBIS syntax guides, presentations with practical model-building laboratory exercises, and other documentation
Includes bibliographical references (p. [733]-743) and index.
1. How the workplace supports successful design -- 2. Introduction to modeling concepts -- 3. Model properties derived from device physics theory -- 4. Measuring model properties in the laboratory -- 5. Using statistical data to characterize component populations -- 6. Using selection guides to compare and contrast components -- 7. Using data sheets to compare and contrast components -- 8. Selecting the best model for a simulation -- 9. Modeling and simulation in the design process flow -- 10. Key concepts of the IBIS specification -- 11. Using IBIS models in what-if simulations -- 12. Fixing errors and omissions in IBIS models -- 13. Using EDA tools to create and validate IBIS models from SPICE -- 14. Sources of IBIS models -- 15. Working with the model library -- 16. Methodology for verifying models -- 17. Verifying model accuracy by using laboratory measurements -- 18. Balancing accuracy against practicality when correlating simulation results -- 19. Deriving an equation-based model from a macromodel -- 20. The challenge to IBIS -- 21. Feedback to the model provider improves model accuracy -- 22. Future trends in modeling -- 23. Using probability : the ultimate future of simulation / Darren J. Carpenter.
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