Scanning electron microscopy and x-ray microanalysis / Joseph I. Goldstein ... [et al.].
Material type:![Text](/opac-tmpl/lib/famfamfam/BK.png)
- 9780306472923
- 502.825 21 SCA
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Learning Resource Centre | Reference Collection | 502.825 SCA (Browse shelf(Opens below)) | Not for loan | 3116 |
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423 OXF The Oxford English dictionary. | 491.43321 OXF Oxford Hindi-English dictionary / | 491.43321 OXF Oxford English-English-Hindi dictionary / | 502.825 SCA Scanning electron microscopy and x-ray microanalysis / | 503 DIC A dictionary of science. | 503 MCG McGraw-Hill encyclopedia of science and technology. | 503 MCG McGraw-Hill encyclopedia of science and technology. |
Includes bibliographical references and index.
Contents: Ch.1. Introduction Ch.2. The SEM and its Modes of operation -- Ch.3. Electron Beam-specimen interactions -- Ch.4. Image formation and interpretation -- Ch.5. Special topics in scanning electron microscopy -- Ch.6. Generation of X-Ray in the SEM specimen -- Ch.7. X-Ray spectral measurement: EDS and WDS -- Ch.8. Qualitative X-Ray analysis -- Ch.9. Quantitative X-Ray analysis: The basics -- Ch.10.Special topics in electron beam X-Ray microanalysis -- Ch.11. Specimen preparation of hard materials: Metals, ceramics, rocks, minerals, microelectronic and packaged devices, particles, and fibers -- Ch.12. Specimen preparation of polymer materials -- Ch.13. Ambient-temperature specimen preparation of biological material -- Ch.14. Low-temperature specimen preparation -- Ch.15. Procedures for elimination of charging in nonconducting specimens
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